4IR workshop - APE&OE

4IR workshop - APE&OE

Professional Development

15 Qs

quiz-placeholder

Similar activities

Battery (Part 1)

Battery (Part 1)

Professional Development

15 Qs

Semana 6 JS

Semana 6 JS

Professional Development

10 Qs

Big Data en la Educación

Big Data en la Educación

University - Professional Development

15 Qs

[W0 Jan23] Quizizz for OW

[W0 Jan23] Quizizz for OW

Professional Development

10 Qs

Join Domain

Join Domain

Professional Development

10 Qs

Module 2 Quiz

Module 2 Quiz

Professional Development

10 Qs

What is doing IBM today?

What is doing IBM today?

Professional Development

10 Qs

Pemanfaatan Chromebook

Pemanfaatan Chromebook

Professional Development

15 Qs

4IR workshop - APE&OE

4IR workshop - APE&OE

Assessment

Quiz

Instructional Technology

Professional Development

Hard

Created by

李菲钰 李菲钰

Used 4+ times

FREE Resource

15 questions

Show all answers

1.

MULTIPLE SELECT QUESTION

30 sec • 1 pt

Which of the following are the applications of Descriptive Analytics?

Frequency

Central tendency

Dispersion

Data distribution

2.

MULTIPLE SELECT QUESTION

30 sec • 1 pt

E2E yield management include which infrastructure in following items

E2E Yield

Yield Analysis

Defect Analysis

Commonality

3.

MULTIPLE CHOICE QUESTION

20 sec • 1 pt

What is the main device of the remote expert system in SDSS?
Smart Glasses, PDA, Computer
Smart Glasses, iPAD, Computer
Smart Glasses, Cellphone, Computer

4.

MULTIPLE CHOICE QUESTION

20 sec • 1 pt

How many coverage of products data to monitor and calculate in 4IR model
0.8
0.9
0.95
1

5.

MULTIPLE SELECT QUESTION

45 sec • 1 pt

Augmented reality (AR) is an interactive experience of a real world environment in which objects in the real world are enhanced by computer-generated perceptual information, sometimes across multiple sensory modes, which senses are included?

Visual

Auditory

Haptic

Somatosensory

Olfactory

6.

MULTIPLE CHOICE QUESTION

20 sec • 1 pt

What's mean CEID/SVID
CEID:Collection event ID; SVID:Status variable ID
CEID:Correct event ID; SVID:Status variable ID
CEID:Correct event ID; SVID:Stable variable ID
CEID:Collection event ID; SVID:Stable variable ID

7.

MULTIPLE CHOICE QUESTION

20 sec • 1 pt

Which system can early predict abnormal pattern by BD level for assy defects

E2E Yield drill down system

Wafer pattern alert system

Strip pattern alert system

LRR reporting system

Create a free account and access millions of resources

Create resources
Host any resource
Get auto-graded reports
or continue with
Microsoft
Apple
Others
By signing up, you agree to our Terms of Service & Privacy Policy
Already have an account?