TA Test-I

_______type of instrument do you need to see a nanoparticle

• Light microscope

• Electron microscope

• Telescope

• Binoculars

 

_________technique getting a three-dimensional picture of the specimen.

• Transmission Electron Microscope

• Scanning Electron Microscope

• Compound Microscope

• Simple Microscope

 

__________technique is suitable for function group detection.

• FTIR

• UV-VIS Spectroscopy

• XRD

• EDX

SEM makes use of  ____________.

• Secondary electrons

• Transmitted electrons

• Auger electrons

• X-rays

 

What occurs when the moving mirror in an FTIR spectrometer is the same distance from the beamsplitter as the static mirror?

• Constructive interference

• Destructive interference

• Radio interference

• The spectrum is measured

What type of technique is FTIR spectroscopy?

• A dispersive technique

• An emission technique

• An absorbance technique

• A reflectance technique

Degree of scattering in transmission electron microscope is a function of __________

• wavelength of electron beam used

• number of atoms that lie in the electron path

• number and mass of atoms that lie in the electron path

• mass of atoms that lie in the electron path

The _________of the sample is determined with the aid of XRD analysis.

• Topography

• Shape/ Morphology

• Atomic Number

• Crystallinity

___________ technique gives an overall mapping of the sample by analyzing near-surface elements and estimates the elemental proportion at different positions.

• UV-VIS Spectroscopy

• NMR

• EDX

• TEM

 The non-conductive SEM sample need to be prepaid with__________

• Dip coating

• Sputter coater

• Surface etching

• Surface lamination