Material Characterization - SEM & FTIR

What does SEM stand for?

• Survey Electron Microscope

• Soft Electron Microscope

• Scanning Electron Microscope

• Scattered Electron Microscope

What is the source of SEM to scan the sample?

• Light

• Electron

• Proton

What is the purpose to study the SEM images?

• To understand the structural properties of the material - surface morphology

• To understand the physical properties of the material - surface morphology

What is the used of magnetic lens in the working principle of SEM?

• Bring the electron to scatter

• Bring the electron to focus

• Bring th electron to diverge

The .......... is the often detection of SEM imaging used to analyse the material.

• X-ray

• Back scattered electron

• Secondary electron

The signal from secondary electron define as the ........

• interaction of the electron beam with atoms at or near to the surface of the material

• interaction of the electron beam with atoms at depth ~ 500 μm

• interaction of the electron beam with atoms outside the surface of the material

To ensure the imaging result is correct and good, the sample are required to

• glass

• non conductive

• electrically conductive

The study of Infrared spectroscopy is use to

• identify the chemical properties

• identify the physical properties

• identify the structural properties

What does FTIR stand for?

• Fourier Transform Invisible Region

• Four Technique Infrared Region

• Fourier Transform Infrared Region

• Four Technique Invisible Region

The dependent variable on an IR spectra is

• wavelength

• frequency squared

• wave number

• transmission